Product Highlights
- DVI Port for External Display
- GPIB and LXI-Compliant (Ethernet)
- USB Device Ports for External Keyboard and Mouse
- Field Replaceable Controller/Power Supply Module
The JDSU MAP-200 Series Multiple Application Platforms are an optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements. Today's rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments. Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.
The MAP-200 mainframes are offered in three configurations for optimal adaptability within test sets: a three-slot configuration and a 19-inch rack, eight-slot configuration with either front- or rear-facing orientation for optimal fiber routing. All three configurations are 3 RU high. The MAP-200 mainframes include all hardware required for bench-top use, including rubber-accented feet located at the corners for optimal stability and vibration isolation. Investment protection is maximized for previous-generation MAP customers using a simple transition kit that allows the insertion of previously field-deployed MAP modules in the MAP-200 mainframe. The MAP-200 also allows users to share the modules within a mainframe.
