Hioki 3504-60 C Hi-Tester (120Hz & 1kHz) with GP-IB, Binning, Contact

Product Highlights

• High speed measurement of 2ms
• Supports C measurements with voltage dependency characteristics through the use of constant voltage testing (CV)
• Model 3504-60 can detect contact failure on all 4 terminals for increased reliability
• BIN function on the 3504-60/-50 is ideal for sorting machines
• Model 3504-40 offers high speed and affordability, perfect for integrating into taping machines
• In all models, contact error is constantly monitored during measurement, contributing to increased yield